Diving into JTAG protocol. Part 3 — Boundary Scan

Diving into JTAG protocol. Part 1 — Overview.
Diving into JTAG protocol. Part 2 — Debugging.

So, let’s continue the “Diving into JTAG” series and in part three we will talk about JTAG Boundary-Scan. This method is used for testing interconnects on PCBs and internal IC sub-blocks. It is defined in the IEEE 1149.1 standard.

But before we get started, a little disclaimer:

As the Socrates said, “The more I know, the more I realize I know nothing.”. And while working on this article I fully realized this statement. It seemed to me that I was already quite well versed in JTAG and the topic of testing microchips using this protocol would not surprise me much, but I was wrong. This at first glance not so complicated topic (what’s so complicated it would seem to set signals on one chip and read from another) at a small immersion turned out to be a whole science in which you need to understand what kinds of faults to look for, how to look for them correctly, how to form test vectors correctly and how to analyze the result and many other things. I am only slightly immersed in this topic and I am considering it from the point of view of an ordinary firmware engineer, just to know and be able to perform a superficial testing of the received board if necessary. Any corrections to inaccuracies I may have made in this article are most welcome.

The Principle of Boundary-Scan

The principle of operation is that special cells — scan cells — are inserted between the physical pins of the chip and its internal logic.

Figure 1 — Boundary Scan Architecture Overview

In normal mode, these cells are transparent and the core is connected to I/O ports. In boundary scan mode, the core is isolated from the ports, and the port signals are controlled by the JTAG interface.

The boundary scan cells are connected to a serial shift register, which is referred to as the boundary scan register (BSR). This register can be used to read and write port states.

In general, the principle of Boundary-Scan operation is that with the help of special JTAG commands, it is possible to set values in the scan cells and through them influence the chip pins.

Following boundary scan instructions are defined in the IEEE standard:

• BYPASS (mandatory): TDI is connected to TDO via a single-shift register.
• SAMPLE (mandatory): Takes a snapshot of the pins of the IC.
• PRELOAD (mandatory): Loads data to the boundary scan register.
• EXTEST (mandatory): Apply preloaded data of the boundary scan register to the ports.
• INTEST (optional): Apply preloaded data of the boundary scan register to the core logic.
• CLAMP (optional): Apply preloaded data of the boundary scan register to the ports and select the BYPASS register as the serial path between TDI and TDO.
• HIGHZ (optional): Places the IC in an inactive drive state (e.g. all ports are set to a high impedance state) and leaves BYPASS register as the selected register.

The structure of the boundary scan chain and the instruction set are described with the Boundary Scan Description Language (BSDL). BSDL is a subset of the Very High-level Design Language (VHDL). The BSDL files are provided by the IC manufacturer. The BSDL language will be covered in the next article, so we will not describe it in detail here.

The Boundary Scan Cells

As mentioned above scan cells are the core element that makes Boundary Scan possible. These cells can be programmatically configured to perform various functions, such as transmitting or receiving data, allowing you to test connections between chips without having to physically access the pins.

Figure 2 — Boundary-scan cell inputs/outputs

Each boundary-scan cell can:

• Capture data on its parallel input PI
• Update data onto its parallel output PO
• Serially scan data from SO to its neighbor’s SI
• Behave transparently: PI passes to PO

At the device level, the boundary-scan elements contribute nothing to the functionality of the internal logic. The boundary-scan path is independent of the function of the device.

The boundary-scan cells must be provided on all device digital input and digital output signal pins, except Power and Ground.

Scan cells can be categorized by functionality into the following types:

Input Cells: used to monitor input signals.

Output Cells: used to control the output signals:

1. Output2: This cell type does not support three-state logic. It can set the pin to state "0" or "1".
2. Output3: This cell type supports three-state logic, allowing a pin to be in the "0", "1" or "Hi-Z" (high impedance) state.

Bidirectional Cells: can be used for both input and output. Cells of this type typically support three-state logic.

Control Cells: used to control other cell types:

1. Control: This cell type can control the functionality of one or more other cells, for example, by switching them between input and output modes. This cell is not connected to the chip pins
2. ControlR: This is similar to the Control type, but with the additional ability to read the state of the controlled cells. This cell is not connected to the chip pins.

Clock Cell. A function that indicates that this cell is connected to the system clock frequency and this allows INTEST mode operation

Each scan cell typically consists of a small set of flip-flops and logic elements that allow it to perform various functions such as storing data, transferring data to other cells, etc.

In general, a scan cell can be represented by the following scheme:

Figure 3 — Boundary-scan cell scheme

A Boundary Scan cell’s internal architecture can be highly different. In its version from 2001, the IEEE Std. 1149.1 describes ten different cell types (BC_1 to BC_10):

• BC_1 – The basic Boundary Scan cell that can be used as an input cell, output cell, control cell, and internal cell. Supports all instructions.
• BC_2 – Boundary Scan cell that can be used as an input cell. Cell architecture is like BC_1 except a multiplexer in the signal patch at the entrance to the cell from the Parallel input.
• BC_3 – Cell only used for inputs or internal cells as it does not possess an Update latch, but it does support the INTEST instruction.
• BC_4 – Like the BC_3, this cell does not possess an Update latch. Also, a multiplexer has been removed from the system signal path. Removing the multiplexer removes some potential signal delay through the cell. This cell cannot be used on any input pin except a system clock.
• BC_5 – Cell can be used as a merged cell application. Merged cells act as an input cell, thus satisfying the requirement that an input pin have a cell and it can also serve to drive the enable of an output driver.
• BC_7 – Cell can provide data to the output driver and also monitor pin activity even when the output drive is driving the pin.
• BC_8 – Cell monitors only the pin driver output and therefore does not support the INTEST instruction.
• BC_9 – A self-monitoring cell for outputs that support the INTEST instruction.
• BC_10 – A self-monitoring cell that does not support the INTEST instruction.

The number of cells need not necessarily match the number of chip pins, for example, if the chip pin is bidirectional, (pin B2 in Figure 4), conceptually at least, three boundary-scan cells are required: one on the input side, one on the output side, and one to allow control of the IO status. In practice, the two IO scan cells are usually combined into a single multi-function cell called a BC_7.

Figure 4 — Bidirectial Boundary-scan cell example

The Boundary Scan Register (BSR)

Boundary Scan Register (BSR) is one of the data registers (DR) consisting of a sequence of scan cells (Boundary-Scan Cells). Figure 5 shows how the scan cells are linked together to form the boundary-scan register. The order of linking within the device is determined by the physical adjacency of the pins and/or by other layout constraints. The boundary-scan register is selected by the EXTEST, SAMPLE, PRELOAD, and INTEST instructions.

Figure 5 — JTAG Registers

During scan operations, data is shifted BSR in the direction from TDI to TDO. The values in the scan cells can be changed or read, allowing testing to be performed.

The size and format of this register determine the number and sequence of scan cells in a particular chip. I.e. before testing it is necessary to find out the length and format of the BSR register. This information is supplied by the manufacturer in the BSDL file format for a particular chip. Here is an example of a truncated BSDL file for the STM32F407 microcontroller:

num       cell        port     function
405       BC_1,        *,      CONTROL,
404       BC_1,        PE2,    OUTPUT3,
403       BC_4,        PE2,    INPUT,   

where,

• num: Is the cell number.
• cell: Is the cell type as defined by the standard.
• port: Is the design port name. Control cells do not have a port name.
• function: Is the function of the cell as defined by the standard. Is one of input, output2,output3, bidir, control or controlr.

We can see from this file that:

• The number of scan cells, and consequently the length of the BSR register is 405 pieces/bit.
• One I/O pin can have 3 scan cells which are divided according to the functionality to be performed: CONTROL, OUTPUT3, INPUT.

This information must be considered when forming the contents of the register BSR.

The Boundary Scan Instructions

SAMPLE Instruction

This command reads the current values from the scan cells and passes them to the TDO output. This is useful for reading the current state of the chip pins. This command causes TDI and TDO to be shorted to the BSR register. However, the chip remains in the normal operating state. During the execution of this command, the BSR register can be used to capture the data exchanged by the chip during normal operation. In other words, with this instruction, we can read signals from the microcontroller output without disturbing its operation.

Figure 6 — JTAG SAMPLE instruction example

In step 3, when the SAMPLE instruction is loaded into the IR register, the signal is read from the pins to the scan cell. In the next steps, we move to the Shift-DR state and read the BSR register along with the value of the pins received in the previous step. Note that when the read unit passes through the scan cells bound to pins B3, B4, B5 the LEDs connected to these pins do not light up, because at the moment the scan cells are not connected to the chip pins.

PRELOAD Instruction

This command allows you to preload certain values into Boundary-Scan Cells for later testing or other operations.

Figure 7 — JTAG PRELOAD instruction example

Here everything is simple after writing the command PRELOAD we just need in the state Shift-DR to write to the register BSR the values in the scan cells for the corresponding pins. And again note that after writing all the values to the scan cells, the LEDs connected to pins B3, B4, B5 do not light up either.

SAMPLE/PRELOAD Instruction

Sometimes two commands: SAMPLE and PRELOAD are combined into one. When writing this command to the IR register, the values of the pins are read into the scan cells (BSR register) and then in the Shift-DR state we read these values and write new values for the pins into the scan cells (BSR register). Again, after the SAMPLE/PRELOAD instruction is completed, has no effect on the pins themselves.

Figure 8 — JTAG SAMPLE/PRELOAD instruction example

Typically, the SAMPLE/PRELOAD command is the first command to be executed during Boundary Scan testing, and it serves as the basis for many other operations.

EXTEST Instructions

The EXTEST command in JTAG is used to test external circuits connected to the microcontroller pins. When the microcontroller is in EXTEST mode, all its function blocks are disabled and the microcontroller pins can be used to test the connected external circuits for short circuits, open circuits, etc. This command can be used to verify the pins and circuits of a microcontroller during the manufacturing process and to verify that external circuits are properly wired during development.

This command is the one for which we wrote values to the scan cells in the PRELOAD command. Because exactly EXTEST makes the scan cells transfer the values of the signals stored in them to the output.

Figure 9 — JTAG EXTEST instruction example

After using this command, the I/O pins are disconnected from the internal logic of the microcontroller and you can no longer control them from the program.

INTEST Instructions

It is also possible to use boundary-scan cells to test the internal functionality of a device. This use of the boundary-scan register is called Internal Test, shortened to Intest. Intest is only really used for very limited testing of the internal functionality to identify defects such as the wrong variant of a device or to detect some gross internal defect.

Figure 10 — JTAG INTEST instruction example

Example of Testing

Let’s see how to use the SAMPLE/PRELOAD and EXTEST instructions to test the board for a fault.

Let’s imagine that we have the following situation: two chips D1 and D2 connected to each other through pins 5,6,7 for chip D1 and 2,3,4 for chip D2 and we need to check that these connections work correctly. But let us assume that a solder bridge has formed between pins D1:6,7 and D2:2,3. The described situation is presented in the figure 11.

Figure 11 — Boundary scan test example

So what can be done using JTAG to check the connection of chips D1 and D2:

1. Load into chip D1 using the PRELOAD command the template: 0b0101010000.
2. Use the EXTEST command to output the generated test pattern to the chip pins.
3. Using the SAMPLE command for the D2 chip, we read the pin states and expect the following result: 0b00001010, but we get 0b00001000. I.e. there is an incorrect signal on pin 2 of chip D2, so the connection D1:7 <--> D2:2 has some problems.

Next part: Diving into JTAG protocol. Part 4 — BSDL

Thanks for the support — https://www.buymeacoffee.com/zamuhrishka

Links

• Boundary-Scan Tutorial
• JTAG Instruction Registers | Boundary Scan Cell | Sample | Preload | Extest | Intest | HIGHZ |
• JTAG Test
• Testing Digital Systems I. Lecture 5: Fault Models
• Everything You Need to Know About ScanWorks Interconnect Part 6: Boundary Scan Cell Descriptions
• JTAGULATOR
• jtag-boundary-scan
• Boundary Scan Basic Tutorial
• OpenOCD boundary scan on STM32
• Lauterbach: Boundary Scan User’s Guide
• 12 3 DFT2 JTAG Instruction
• 12 4 DFT2 Instruction2Conclude